SMART Error Log Version: 1
ATA Error Count: 2296 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It “wraps” after 49.710 days.
Error 2296 occurred at disk power-on lifetime: 12107 hours (504 days + 11 hours)
When the command that caused the error occurred, the device was active or idle
.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
— — — — — — —
40 51 03 e4 22 80 e3 Error: UNC 3 sectors at LBA = 0x038022e4 = 58729188
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA
_of_first_error
# 1 Short offline Completed without error 00% 12107 –
# 2 Short offline Completed without error 00% 12107 –
Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SMART情報のRAWデータで、以下の31h=49℃は動作中最高温度、11h=17℃は動作中最低温度のようです。下記のツールでもLifetime Min/Max
と表示されています。（日立、富士通のHDDで確認済み）
C2 100 100 __0 003100110026 温度
あと、SMART情報のError logは取得できないのでしょうか。
以下のツールで取得できます。不具合発生時の詳細情報が取得できるようです。
http://sourceforge.net/project/showfiles.php?group_id=64297
出力例 (中略）
194 Temperature_Celsius 0x0022 100 100 000 Old_age Always –
39 (Lifetime Min/Max 17/49)
195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always – 51
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always – 440139776
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always – 0
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline – 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always – 0
200 Multi_Zone_Error_Rate 0x000f 100 100 060 Pre-fail Always – 11305
203 Run_Out_Cancel 0x0002 100 100 000 Old_age Always – 2628522018466
240 Head_Flying_Hours 0x003e 200 200 000 Old_age Always – 0
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
温度の過去最高温度と最低温度については、対応 HDD が一部であることや UI 構成が難しいことから対応していません。
self-test については対応要望はあるのですが私自身が一度も利用したことがないので…。対応するとなると、USB 接続でも対応が必要なので二の足は踏んでいます。需要があることは間違いないので検討はしてみます。
手許のHGST2.5inchのHDDから上記ツールで取得したエラーログを貼り付けます。
self testは別として、Error Logは取得できたほうがいいのではないでしょうか。
194 Temperature_Celsius 0x0002 203 203 000 Old_age Always –
27 (Lifetime Min/Max 23/45)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always –
5
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always –
3
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline –
0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always –
0
SMART Error Log Version: 1
ATA Error Count: 2296 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It “wraps” after 49.710 days.
Error 2296 occurred at disk power-on lifetime: 12107 hours (504 days + 11 hours)
When the command that caused the error occurred, the device was active or idle
.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
— — — — — — —
40 51 03 e4 22 80 e3 Error: UNC 3 sectors at LBA = 0x038022e4 = 58729188
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
— — — — — — — — —————- ——————–
c8 00 08 df 22 80 e3 00 00:02:31.500 READ DMA
c8 00 08 d7 22 80 e3 00 00:02:31.500 READ DMA
c8 00 08 cf 22 80 e3 00 00:02:31.500 READ DMA
c8 00 08 c7 22 80 e3 00 00:02:31.500 READ DMA
c8 00 08 bf 22 80 e3 00 00:02:31.500 READ DMA
Error 2295 occurred at disk power-on lifetime: 12107 hours (504 days + 11 hours)
When the command that caused the error occurred, the device was active or idle
.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
— — — — — — —
40 51 03 e4 22 80 e3 Error: UNC 3 sectors at LBA = 0x038022e4 = 58729188
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
— — — — — — — — —————- ——————–
c8 00 08 df 22 80 e3 00 00:02:26.300 READ DMA
c8 00 08 d7 22 80 e3 00 00:02:26.300 READ DMA
c8 00 08 cf 22 80 e3 00 00:02:26.300 READ DMA
c8 00 08 c7 22 80 e3 00 00:02:26.300 READ DMA
c8 00 08 bf 22 80 e3 00 00:02:26.300 READ DMA
Error 2294 occurred at disk power-on lifetime: 12107 hours (504 days + 11 hours)
When the command that caused the error occurred, the device was active or idle
.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
— — — — — — —
40 51 03 e4 22 80 e3 Error: UNC 3 sectors at LBA = 0x038022e4 = 58729188
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
— — — — — — — — —————- ——————–
c8 00 08 df 22 80 e3 00 00:02:21.400 READ DMA
c8 00 08 d7 22 80 e3 00 00:02:21.400 READ DMA
c8 00 08 cf 22 80 e3 00 00:02:21.400 READ DMA
c8 00 08 c7 22 80 e3 00 00:02:21.400 READ DMA
c8 00 08 bf 22 80 e3 00 00:02:21.400 READ DMA
Error 2293 occurred at disk power-on lifetime: 12106 hours (504 days + 10 hours)
When the command that caused the error occurred, the device was active or idle
.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
— — — — — — —
40 51 03 e4 22 80 e3 Error: UNC 3 sectors at LBA = 0x038022e4 = 58729188
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
— — — — — — — — —————- ——————–
c8 00 08 df 22 80 e3 00 00:02:17.300 READ DMA
c8 00 08 d7 22 80 e3 00 00:02:17.300 READ DMA
c8 00 08 cf 22 80 e3 00 00:02:17.300 READ DMA
c8 00 08 c7 22 80 e3 00 00:02:17.300 READ DMA
c8 00 08 bf 22 80 e3 00 00:02:17.300 READ DMA
Error 2292 occurred at disk power-on lifetime: 12106 hours (504 days + 10 hours)
When the command that caused the error occurred, the device was active or idle
.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
— — — — — — —
40 51 03 e4 22 80 e3 Error: UNC 3 sectors at LBA = 0x038022e4 = 58729188
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
— — — — — — — — —————- ——————–
c8 00 08 df 22 80 e3 00 00:02:13.700 READ DMA
c8 00 08 d7 22 80 e3 00 00:02:13.700 READ DMA
c8 00 08 cf 22 80 e3 00 00:02:13.700 READ DMA
c8 00 08 c7 22 80 e3 00 00:02:13.700 READ DMA
c8 00 08 bf 22 80 e3 00 00:02:13.700 READ DMA
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA
_of_first_error
# 1 Short offline Completed without error 00% 12107 –
# 2 Short offline Completed without error 00% 12107 –
Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.